项 目 Item |
要 求 Requirement |
|
电学性能 electronic characters | ||
导电类型(type) |
P型 (B dopant) |
|
电阻率(resistivity)(Ω·cm) |
1.0~3.0 |
|
硅锭的少子寿命(minimum lifetime of bricks)(μs) |
≥5(average) |
|
氧含量(oxygen)(ppma) |
≤10 |
|
碳含量(carbon)(ppma) |
≤16 |
|
晶体结构 crystal structure | ||
微晶(micro-grains) |
无(no) |
|
表面质量 appearance | ||
硅落、缺口、裂纹、沾污、针孔(chips,V-shape, crack, stain, pinhole) |
无(Not allow) |
|
崩边(edge chips)(mm) |
L≤ 0.5,W≤ 0.3,no more than 2/wafer |
|
线痕(μm) (saw marks) |
≤15 |
|
弯曲度/翘曲度(bow/warp)(μm ) |
≤50 |
|
尺寸 dimension | ||
边长(side length)(mm) |
156.75±0.25 |
|
厚度(center thickness) (μm) |
200 |
|
180 | ||
TV(μm) |
200 |
±20 |
180 |
±15 |
|
TTV(μm) |
200 |
≤30 |
180 |
≤25 |
|
垂直度(verticality ) |
90 o±0.3o |
|
包装与储运 package and carriage | ||
包装(package) |
1盒400片;1箱1600片;1托48000片。 |
|
400pcs/box,1600pcs/case,48Kpcs/pallet | ||
储存(Storage) |
温度(temperature.):10℃~40℃ |
|
湿度(humidity):≤70% | ||
规格(mm) |
尺寸Dimension(mm) |
|||||
A(Length) |
B(Diagonal length) |
C(Bevel edge width) |
||||
Max. |
Min. |
Max. |
Min. |
Max. |
Min. |
|
156.75P |
157 |
156.5 |
221.5 |
219.3 |
2 |
0.5 |
注:1.硅片的规格与电池片规格相对应; | ||||||
2.A、B、C分别参见图1。 | ||||||
Notice: 1.The dimension of wafer is related to the cell | ||||||
2.A、B、C refer to Fig. 1 | ||||||
图1 多晶硅片尺寸示意图 | ||||||
Fig1 Sketch map of multi-Si wafer | ||||||
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